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میکروسکوپ‌های الکترونی عبوری روبشی: تصویربرداری و آنالیز

 

فهرست کتاب:

1- A Scan Through the History of STEM
2- The Principles of STEM Imaging
3- The Electron Ronchigram
4- Spatially Resolved EELS: The Spectrum-Imaging Technique and Its Applications
5- Energy Loss Near-Edge Structures
6- Simulation and Interpretation of Images
7- X-Ray Energy-Dispersive Spectrometry in Scanning Transmission Electron Microscopes
8- STEM Tomography
9- Scanning Electron Nanodiffraction and Diffraction Imaging
10- Applications of Aberration-Corrected Scanning Transmission Electron Microscopy and Electron Energy Loss Spectroscopy to Complex Oxide Materials
11- Application to Ceramic Interfaces
12- Application to Semiconductors
13- Nanocharacterization of Heterogeneous Catalysts by Ex Situ and In Situ STEM
14- Structure of Quasicrystals
15- Atomic-Resolution STEM at Low Primary Energies
16- Low-Loss EELS in the STEM
17- Variable Temperature Electron Energy-Loss Spectroscopy
18- Fluctuation Microscopy in the STEM